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Ex parte HYNECEK et al. - Page 8Legal Research Home > Board of Patent Appeals and Interferences > 2000 > Ex parte HYNECEK et al. - Page 8
Appeal No. 1998-1698
Application No. 08/411,033
citation by the examiner in proper context, we include the entire paragraph in which the
citation is found. Hieda states at column 8, lines 10-47 that:
the charges accumulated during the period T are not used and are
2
eliminated, while the charges accumulated during the following period T are
1
read out and used. Thus, in this case the period T is a substantial
1
integration period. When a large quantity of charge is accumulated during
the period T , even if charge transfer is carried out at some intermediate
2
point, the unwanted charges may not be completely eliminated, so that a
certain quantity of harmful charge may remain in the imaging part 2. For this
reason, in this embodiment, the anti-blooming gate pulses NABG are
applied to the electrode 2ABG intermittently, i.e., during each horizontal
blanking period HBLK, (which is the low level period of a horizontal blanking
pulse HBLK shown in FIG. 7) so as to reduce the quantity of charge to be
accumulated during the period T . Furthermore, during the substantial
2
integration period T , it is preferable to successively apply the anti-blooming
1
gate pulses NABG to the electrode 2ABG to prevent blooming. It is possible
to vary the anti-blooming ability or power by changing the frequency and/or
amplitude of the anti-blooming gate pulses NABG to be applied to the
electrode 2ABG. Either method may be adopted, depending on
circumstances. Here, if the anti-blooming gate pulses NABG are
successively applied to the electrode 2ABG during the long period T , noise
2
would be introduced at the output amplifier 5 and would harm the displayed
image on the screen. This would also be disadvantageous in terms of
power consumption because of the successive high frequency pulses. To
solve this problem, in this embodiment, the anti-blooming gate pulses NABG
are applied intermittently, I e., only during each horizontal blanking period in
the period T . Applying the anti-blooming gate pulses NABG only during
2
each horizontal blanking period is advantageous, since the noise due to the
pulses NABG is concentrated in the horizontal blanking period and therefore
the displayed image is not harmed.
Here, Hieda is concerned with the elimination of unwanted changes which may be
harmful, therefore, the anti-blooming gate pulses NABG are applied to the electrode 2ABG
8
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