Ex parte FONASH et al. - Page 2




          Appeal No. 1997-1319                                                        
          Application 08/290,227                                                      


          and 27, which constitute all the claims remaining in the                    
          application.                                                                
          The disclosed invention pertains to a method for                            
          producing a large grain highly conductive thin film material.               
          The process begins by depositing upon a substrate a film of                 
          amorphous material such as amorphous silicon.  The amorphous                
          film is then annealed which creates nuclei and induces the                  
          growth of large grain crystals.  The resulting material is                  
          said to have conductivity characteristics substantially                     
          greater than the original amorphous material.                               
          Representative claim 26 is reproduced as follows:                           
               26.  A process for producing a large grain highly                      
          conductive thin film material without use of ion implantation,              
          the process comprising the following steps:                                 
               (a) depositing upon a substrate a film of amorphous                    
          precursor material that is substantially free of crystal                    
          growth-inducing nuclei and sites, said film having a thickness              
          T and a first electrical conductivity S1;                                   
               (b) following step (a), annealing said film to create                  
          nuclei and induce growth of large grain crystals having                     
          lateral dimensions substantially larger than said thickness T,              
          and to produce a second electrical conductivity S2 that is at               
          least about 10  greater than S1.4                                                             
          The examiner relies on the following references:                            
          Guckel et al. (Guckel)            4,897,360      Jan. 30, 1990              
          Chiang et al. (Chiang)            4,904,611      Feb. 27, 1990              
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