Appeal No. 1997-4069 Page 7
Application No. 08/282,913
Claims --American Perspectives, 21 Int'l Rev. Indus. Prop. &
Copyright L. 497, 499, 501 (1990)).
Here, claims 1-13 each specify in pertinent part the
following limitations:
testing an integrated circuit in a system level
environment using an actual electrical system in
answer the integrated circuit is intended to be used
to operate the integrated circuit during the
testing, ... the integrated circuit to be tested
being operatively connected to the electrical system
when the testing occurs, the method comprising the
steps of:
...
operating the electrical system in a manner
which exercises the exposed die; and
using the sensor probe to directly monitor the
die while the exposed die is being exercised by the
operation of the electrical system in which the
integrated circuit is intended to be used.
Similarly, claims 14-17 each specify in pertinent part the
following limitations:
a test platform arranged to support a board
level module that carries a multiplicity of
electrically connected components that make up at
least a part of an overall electrical system in
which the integrated circuit is intended to be used,
the platform supporting the board level module such
that the board level module remains operatively
connected to the electrical system during the
testing procedure;
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