Ex parte TAKAKU - Page 1



               The opinion in support of the decision being entered                   
                    today was not written for publication and is                      
                         not binding precedent of the Board                           
                                                       Paper No. 29                   
                       UNITED STATES PATENT AND TRADEMARK OFFICE                      
                                    _______________                                   
                           BEFORE THE BOARD OF PATENT APPEALS                         
                                   AND INTERFERENCES                                  
                                    _______________                                   
                                Ex parte TOSHIAKI TAKAKU                              
                                     ______________                                   
                                   Appeal No. 2000-0156                               
                              Application 08/531,023                                  
                                    _______________                                   
                              ON BRIEF                                                
                                    _______________                                   
          Before THOMAS, LALL and GROSS, Administrative Patent Judges.                
          THOMAS, Administrative Patent Judge.                                        

                                   DECISION ON APPEAL                                 
               Appellant has appealed to the Board from the examiner’s                
          final rejection of claims 6, 8, 9, 11, 12 and 14.                           
               Independent claim 6 is reproduced below:                               
               6.  In a thermal chemical vapor deposition apparatus having            
          a quartz glass reaction tube that is used for heat-treating                 
          semiconductor wafers, the improvement which comprises:                      
               making the quartz glass reaction tube from transparent                 
          quartz glass; and                                                           
               providing the quartz glass reaction tube with at least one             
          sand-blasted internal wall surface portion, which at least one              
          said-blasted internal wall surface portion has a center-line mean           
          roughness in the range of 1 Fm to 20 Fm and is heated by a heater           
          during heat-treatment.                                                      

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