Ex parte WEI - Page 3




              Appeal No. 2000-2093                                                                  Page 3                 
              Application No. 08/730,385                                                                                   


                     Rather than reiterate the conflicting viewpoints advanced by the examiner and the                     
              appellant regarding the above-noted rejections, we make reference to the Answer (Paper                       
              No. 22) and the final rejection (Paper No. 17) for the examiner's complete                                   
              reasoning in support of the rejections, and to the Brief (Paper No. 21) for the appellant's                  
              arguments thereagainst.                                                                                      
                                                        OPINION                                                            
                     In reaching our decision in this appeal, we have given careful consideration to the                   
              appellant's specification and claims, to the applied prior art reference, and to the                         
              respective positions articulated by the appellant and the examiner.  As a consequence of                     
              our review, we make the determinations which follow.                                                         
                     The appellant’s invention is directed to a method and apparatus for polishing a                       
              silicon wafer.  In the course of the invention, three motions act on the wafer, which is held                
              on a wafer holder.  The first motion is provided by a platen that has a polishing pad on its                 
              surface and which rotates with respect to the wafer as polishing slurry is deposited on the                  
              pad.  The second motion is provided by rotating the wafer holder while pressing the wafer                    
              mounted thereon against the pad on the rotating platen.  The third motion results from                       
              mounting the rotatable wafer holder on a crank and then rotating the crank to cause the                      
              wafer holder to orbit with respect to the rotating platen.                                                   











Page:  Previous  1  2  3  4  5  6  7  8  9  10  11  12  Next 

Last modified: November 3, 2007