Ex parte CHAPMAN et al. - Page 2




          Appeal No. 1999-0011                                                        
          Application No. 08/428,812                                                  


               The invention is related to an improved multi-bit error                
          correction system.  The inventive error correction system                   
          performs a fast error correcting operation on individual bits               
          within multi-bit modules.  In the specific implementation, the              
          invention uses Hamming code decoders, m modules for a n x m                 
          bit data word, with each module having m bits.  The error bits              
          of each module are combined to form a set of parity bits.                   
          Syndrome bits are generated from the parity bits and used to                
          locate errors in the bits.  Finally, errors in the bits are                 
          corrected in a conventional manner to provide corrected data                
          bits.  Thus, the invention provides a high speed error                      
          detection and correction technique for data containing multi-               
          bit words.                                                                  
               The invention is further illustrative by the following                 
          claim.                                                                      
          Claim 1.  An improved multi-bit error correction system                     
          comprising:                                                                 
               first means for providing an n times m bit data word and               
               second means for correcting multiple bits in said data                 
          word[,] said second means including m parallel one bit Hamming              
          code decoders.                                                              
               The examiner relies on the following references:                       

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