Ex parte DOYLE et al. - Page 3




              Appeal No. 1999-0886                                                                                       
              Application No. 08/722,738                                                                                 


              charge in the capacitor, hot carriers must be generated during programming for storage in                  
              the capacitor.                                                                                             
                     Representative independent claim 1 is reproduced as follows:                                        
                            1. A electronic programmable read-only-memory comprising:                                    
                            (a) a field effect transistor having: relatively heavy doped source and                      
                     drain regions separated by an oppositely doped channel region; a gate                               
                     electrode disposed over the channel region; lightly doped regions, having                           
                     the same conductivity type as the source and drain regions, extending                               
                     laterally from the source and drain regions to peripheral regions of the                            
                     channel region; and, relatively heavy doped regions, having the same                                
                     conductivity type as the source and drain regions, extending laterally from the                     
                     source and drain regions, through and beyond the lightly doped regions, into                        
                     the channel region; and                                                                             
                            (b) a charge storing capacitor coupled to the gate electrode and                             
                     adapted to store charge produced in the channel region in response to a                             
                     logic state programming voltage applied between one of the source and                               
                     drain regions and the gate electrode.                                                               
                     The examiner relies on the following references:                                                    
                     Nakamura et al.  (Nakamura)                5,300,799            Apr. 05, 1994                       
                     Hamamoto et al. (Hamamoto)                 5,146,300            Sep. 08, 1992                       
                     Miller et al.   (Miller)           5,046,043             Sep. 03, 1991                              
                     Momi                                       JP 06-132,489        May  13, 1994                       
                     Claims 1-6 stand rejected under 35 U.S.C. § 103.  As evidence of obviousness, the                   
              examiner offers Nakamura and Momi with regard to claims 1, 2, 4 and 5, adding                              
              Hamamoto and Miller to the combination with regard to claims 3 and 6.                                      



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