Appeal No. 2000-2053
Application No. 08/764,353
chip is faulty then the design or manufacturing process can be
altered to produce the desired results.
The following claim further illustrates the invention.
1. An electronic probe apparatus for testing an electronic
circuit comprising an array of probe wires having tip ends
adapted to contact said electronic circuit, said probe wires
extend outward from said tip ends and extend into an epoxy
material and are held in place therein, said epoxy material has
an electrically insulating surface and has electronic components
mounted on said insulating surface, connections are being made
between said components and said probe wires by electrically
conducting lines formed on said insulating surface of said epoxy
material, said connections are being made between said conducting
lines and said probe wires between said tip ends and said epoxy
material.
The Examiner relies on the following reference:
Cherry1 4,780,670 Oct. 25, 1988
Claims 1-4 and 17 stand rejected under 35 U.S.C. § 103(a) as
being unpatentable over Cherry.
Rather than repeat the arguments of Appellants and the
Examiner, we make reference to the brief (paper no. 25, labeled
as the supplemental appeal brief, which is the same brief as
paper no. 21 labeled as the appeal brief except for formalities)
and the answer (paper no. 22) for the respective details thereof.
1 U.S. Patent to D’Souza (5,323,107) which was used in the
final rejection is apparently withdrawn from rejection in the
Examiner’s answer, see answer at page 3.
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