Ex Parte YANG et al - Page 9



          Appeal No. 2001-0607                                                        
          Application No. 09/244,429                                                  

          arrangement comprises a plurality of silicon-based layers and has           
          a thickness of no greater than about 800 D.”                                
               With regard to the product-by-process arguments of                     
          appellants and the examiner, we agree with the examiner that a              
          determination of patentability in “product-by-process” claims is            
          based on product itself, even though such claims are limited and            
          defined by process, and thus the product in such a claim is                 
          unpatentable if it is the same as, or obvious from, product of              
          the prior art, even if the prior product was made by different              
          process.  It would not be error to affirm an examiner’s rejection           
          of “product-by-process” claims, absent proof by applicant that              
          prior art products do not necessarily or inherently possess                 
          characteristics of his claimed product.  In re Thorpe, 777 F.2d             
          695, 227 USPQ 964 (Fed. Cir. 1985).                                         
               However, the examiner must first show that the claimed                 
          structure, or the product itself, exists in the prior art.  Since           
          it is our view that the structure of claim 18, with regard to the           
          specifically claimed control gate arrangement, has not been shown           
          to be in the prior art or suggested by the prior art, we never              
          get to the product-by-process claims 24 and 25.                             
               It may be true that it is appellants’ unique process which             
          enables such a small thickness for the multi-layered control gate           
                                         -9–                                          




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