Ex Parte EDWARDS et al - Page 3




          Appeal No. 2000-1244                                                            
          Application 08/826,111                                                          


          reflective layer 16 has greater than 25% reflectivity at the                    
          wavelength of interest.  See page 7 of Appellants’ specification.               
               As shown in figure 3, the refractive index of amorphous                    
          selenium also has a very low imaginary component (K) over a range               
          of wavelengths from 600 to 800 nm.  A low K is necessary to allow               
          the double transmission of light through partially reflective                   
          layer 16 without significant loss to enable readout of highly                   
          reflective layer 20.  See page 7 of Appellants’ specification.                  
               Independent claim 1 present in the application is produced                 
          as follows:                                                                     
               1.  An optical storage medium from storing information in at               
          least two separate layers, the medium comprising, in order:                     
               a transparent substrate having a pattern of pits in one                    
          major surface thereof;                                                          
               a partially reflective layer, adjacent the substrate,                      
          comprising amorphous selenium;                                                  
               a transparent spacer layer; and                                            
               a highly reflective layer;                                                 
               wherein the medium is designed for use with a focused laser                
          beam having a wavelength 8 positioned to enter the medium                       
          through the substrate, wherein the beam may be adjusted to be                   
          focused on each of the partially reflective layer and the highly                
          reflective layer, and further wherein the partially reflective                  
          layer has a thickness within ± 10% 8/4n8, where the partially                   
          reflective layer has an index of refraction having a real                       
          component (n) having a value measured at 8 of n8.                               


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