Ex Parte VIGNA et al - Page 2




              Appeal No. 2001-0684                                                                                      
              Application No. 09/205,668                                                                                


                                                   BACKGROUND                                                           
                     Appellants’ invention relates to an integrated electronic device comprising a                      
              mechanical stress protection structure.  An understanding of the invention can be                         
              derived from a reading of exemplary claim 1, which is reproduced below.                                   
                     1.     An integrated electronic device comprising:                                                 
                            a semiconductor material body;                                                              
                            an electronic component housed in said semiconductor material                               
                     body and having a periphery;                                                                       
                            an electrically insulating region extending on top of said                                  
                     semiconductor material body and including a central portion positioned                             
                     directly above all of the electronic component;                                                    
                            a pad region extending on top of said electrically insulating region;                       
                     and                                                                                                
                            a protection structure of a material different from and extending into                      
                     said electrically insulating region, said protection structure contacting and                      
                     extending downward from portions of the pad region that are not directly                           
                     above said electronic component, said protection structure including a                             
                     peripheral portion extending around a predominant part of the central                              
                     portion of the electrically insulating region.                                                     

                     The prior art references of record relied upon by the examiner in rejecting the                    
              appealed claims are:                                                                                      
              Chittipeddi et al. (Chittipeddi)          5,751,065                   May 12, 1998                        
                                                                             (Filed Oct. 30, 1995)                      
              Wollesen                                  5,900,668                   May 4, 1999                         
                                                                             (Filed Nov. 30, 1995)                      


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