CHEUNG et al vs. RITZDORF et al - Page 18




                Interference No. 105,113                                                                                                      

                The specification explains:                                                                                                   
                                 A comparison between Figs. 4E and 4F [sic: 2E and 2F] reveals that an                                        
                         increase in the grain size of the copper layer 440 has taken place.  Traditionally,                                  
                         the change in the grain size has been forced through an annealing process.  In such                                  
                         an annealing process, the wafer is subject to an elevated temperature that is                                        
                         substantially above the ambient temperature conditions normally found in a clean                                     
                         room.  For example, such annealing usually takes place in a furnace having a                                         
                         temperature generally around or slightly below 400 degrees Celsius, or about half                                    
                         of the melting temperature of the electrodeposited copper. . . .                                                     
                                 Absent such an annealing step, the traditional view is that the substantial                                  
                         number of grains per given volume in such sub-micron structures significantly                                        
                         decreases the electromigration resistance of the metal lines that are produced and                                   
                         gives the material a higher resistivity.  This is due to the fact that grain boundary                                
                         migration occurs with a much lower activation energy that trans-granular                                             
                         migration.  As such, conventional wisdom dictates that a separate annealing step                                     
                         is required.                                                                                                         
                                 The present inventor has found that such a separate annealing step in                                        
                         which the electrochemically deposited copper is subject to a subsequent high                                         
                         temperature annealing process (e.g., at about 400 degrees Celsius) is not, in fact,                                  
                         necessary.   Rather, electrochemically deposited copper metallization having grain                                   
                         sizes substantially smaller than the sub-micron structures that they fill may be                                     
                         subject to an annealing process in which the annealing of the copper metallization                                   
                         takes place at, for example, room temperature or at temperatures substantially                                       
                         below 400 degrees Celsius where the annealing process is more easily controlled                                      
                         and throughput is increased.                                                                                         
                Id. at 11, l. 16 to p. 13, l. 3 (our emphasis).   The reference to "furnace" in the first of these                            
                paragraphs is clearly limited to prior-art, high-temperature annealing and thus does not                                      
                demonstrate an intent by the Ritzdorf inventors to employ an annealing furnace in their                                       
                invention, as asserted in Ritzdorf's opposition in arguing that this annealing furnace provides                               
                written description support for the annealing "chamber" recited in Ritzdorf's claims.                                         
                Opposition 2, at 5, ¶ 8.                                                                                                      



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