Ex Parte Ishimura et al - Page 1



            The opinion in support of the decision being entered today was not written
                   for publication and is not binding precedent of the Board.         


                       UNITED STATES PATENT AND TRADEMARK OFFICE                      
                                     ____________                                     
                          BEFORE THE BOARD OF PATENT APPEALS                          
                                   AND INTERFERENCES                                  
                                     ____________                                     
                               Ex parte YOUICH ISHIMURA                               
                                and YOSHIFUMI TOMOMATSU                               
                                     ____________                                     
                                 Appeal No. 2005-0285                                 
                              Application No. 09/881,675                              
                                     ____________                                     
                                  HEARD: May 4, 2005                                  
                                     ____________                                     
          Before KRASS, BARRY, and SAADAT, Administrative Patent Judges.              
          KRASS, Administrative Patent Judge.                                         

                                  DECISION ON APPEAL                                  
               This is a decision on appeal from the final rejection of               
          claims 1-10.                                                                
               The invention is directed to a field-effect semiconductor              
          device.  In particular, an insulated gate bipolar transistor is             
          provided whereby nitrogen is included in a barrier metal layer              
          for improving threshold voltage characteristics after annealing             
          processing.                                                                 
               Representative independent claim 1 is reproduced as follows:           
               1. A field-effect semiconductor device having a                        
          semiconductor layer of a first conductivity type, a collector               




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