Ex Parte Beitel et al - Page 5



               Appeal No. 2005-2276                                                                                               
               Application No. 09/734,467                                                                                         

               coefficients in the respective layers (see column 1, lines 17-20).  Azuma further discloses                        
               applying a titanium adhesion layer between the poorly bonding layers to reduce cracking (i.e., by                  
               providing better bonding between the layers) (column 1, lines 34-37).  Although both references                    
               may be concerned with surface irregularities in a very broad sense, the examiner does not seem                     
               to recognize that the type of surface irregularities and the causes and the solutions of these                     
               surface irregularities are different in each reference.  Therefore, an artisan would not have been                 
               motivated to modify Kawakubo to avoid “short-inducing surface irregularities” as urged by the                      
               examiner particularly because Kawakubo’s aforementioned solution (i.e., use of Pt-Ti alloy)                        
               already avoids the occurrence of “metal flow” or surface irregularities.                                           
                      The above discussed rejection is further deficient in another respect.  There is no                         
               suggestion that the semiconductor memory device of Kawakubo would not be damaged if                                
               subjected to the high temperature heat treatment of Azuma.  Therefore, an artisan would have                       
               been discouraged from providing Kawakubo’s process with Azuma’s heating step due to the                            
               possibility that the high temperature could damage or destroy the semiconductor memory device.                     
               Stated differently, such a provision would not have a reasonable expectation for success as                        
               required for obviousness under Section 103.  See In re O’Farrell, 853 F.2d 894, 903-904, 7                         
               USPQ 2d 1673, 1681.                                                                                                
                      For the above stated reasons, we cannot sustain the examiner’s Section 103 rejection of                     
               appealed independent claim 1 along with claims 2-3, 7, 11-13, 15 and 17 as being obvious over                      







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