Ex Parte Beaman et al - Page 3



          Appeal No. 2006-1181                                                        
          Application No. 10/393,718                                                  

          and the answer (mailed January 13, 2005) for the respective                 
          positions of Appellants and the Examiner.  Only those arguments             
          actually made by Appellants have been considered in this                    
          decision.  Arguments which Appellants could have made but chose             
          not to make in the brief have not been considered (37 CFR                   
          § 41.37(c)(1)(vii)).                                                        
                                       OPINION                                        
               In rejecting the claims under 35 U.S.C. § 1032, the Examiner           
          relies on Wristers for showing all the claimed features except              
          for a description of the characteristics of the semiconductor               
          device and creation of a depletion region when the first voltage            
          is applied (answer, page 4).  The examiner further relies on Wolf           
          for describing the formation of a depletion region in the                   
          substrate in an area adjacent the isolation layer upon                      
          application of a voltage that exceeds a threshold voltage (id.).            

                                                                                     
               2  The rejection of claim 19 under the first paragraph of 35 U.S.C.    
          § 112, for insufficient written description, stated in the final rejection  
          (mailed May 11, 2005), has been withdrawn by the Examiner (answer, page 6). 





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