Ex Parte Lim et al - Page 6


                   Appeal No. 2006-1628                                                                                           
                   Application No. 09/840,082                                                                                     


                   with a margin sufficient to block light incident on the metal thin film [answer,                               
                   pages 3-5].                                                                                                    
                          The examiner cites Murade as teaching a light shielding member that                                     
                   covers and extends over the source/drain region of a TFT to block incident light                               
                   onto the source/drain region.  The examiner also indicates that Murade's light-                                
                   shielding member extends over the upper electrode of the storage capacitor                                     
                   [answer, pages 5 and 6].  The examiner finds that it would have been obvious to                                
                   one of ordinary skill in the art at the time of the invention to extend the light-                             
                   shielding film of the admitted prior art to cover the drain electrode and upper                                
                   electrode of the storage capacitor to block incident light thereon to (1) minimize                             
                   TFT leakage current; (2) improve display contrast; and (3) display high-quality                                
                   images free from image-degrading effects, such as cross-talk [answer, page 6].                                 
                          Regarding independent claims 1, 9, 11, and 19, appellants argue that                                    
                   Murade does not suggest that the metal thin film of the drain electrode of the TFT                             
                   should be covered by the light-shielding layer with a margin sufficient to block                               
                   light incident on the metal thin film as claimed [brief, page 8; emphasis in                                   
                   original].  Rather, appellants note that Murade only concerns shielding the                                    
                   semiconductor channel region and LDD regions of the TFT from incident light to                                 
                   minimize leakage current because light affects the electrical conductivity of                                  
                   semiconductor/polysilicon materials [brief, pages 8 and 9; reply brief, page 2].                               
                   Murade, however, is not concerned with shielding the claimed metal thin film                                   




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