Ex parte CLOUTIER et al. - Page 4




          Appeal No. 95-1994                                                          
          Application 07/732,493                                                      


          part of the prior art admitted by appellants and discussed at               
          specification page 1, line 25 through page 3, line 20. Page 2               
          of the specification discusses in detail the formula C = KAr                
          divided by D.  Thus, the capacitance “C” of a sensor is                     
          determined by the product of the permittivity “K” and the                   
          overlapping surface area “Ar” of a conductive area with a                   
          sensor, divided by the distance “D” between the respective                  
          conductive area and the sensor.  The sensor during its use                  
          itself forms a separate capacitor with the conductive surface               
          which is grounded.  The above equation is labeled equation                  
          (1).                                                                        


               The text at page 3 of the specification as filed at lines              
          8 through 20 states the following:                                          
                         Equation (1) shows that for                                  
                         constant dielectric value K and                              
                         overlapping surface Ar, the                                  
                         capacitance C, ..., varies according                         
                         to the inverse of the distance D                             
                         separating the sensor from the                               
                         conductive part, making possible the                         
                         mentioned method for dynamic and non-                        
                         contact measurement of the distance                          
                         between the nearest capacitive sensor                        
                         plate from a conductive part and the                         
                         conductive part.                                             

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