Ex parte NISHIZAWA - Page 2




          Appeal No. 95-3573                                                          
          Application No. 07/839,704                                                  


               The disclosed invention relates to a semiconductor memory              
          cell array that comprises a semiconductor body, a plurality of              
          bit lines and a plurality of word lines crossing the bit lines to           
          form a matrix, and at least one semiconductor memory cell                   
          disposed in the semiconductor body at each crossing of the bit              
          lines and the word lines.                                                   
               Claim 45 is illustrative of the claimed invention, and it              
          reads as follows:                                                           
               45.  A semiconductor memory cell array comprising:                     
               a semiconductor body, a plurality of bit lines and a                   
          plurality of word lines crossing said bit lines to form a matrix            
          and at least one semiconductor memory cell disposal at one of the           
          cross points of said bit lines and word lines, said semiconductor           
          memory cell including:                                                      
               a source region formed with a low resistivity semiconductor            
          region of a first conductivity type for supplying and retrieving            
          charge carriers;                                                            
               a storage region formed with a semiconductor region of said            
          first conductivity type and disposed separate from said source              
          region and constituting one electrode of a capacitor for storing            
          signal charge;                                                              
               means for forming the other electrode of said capacitor;               
               a channel region formed with a high resistivity                        
          semiconductor region of said first conductivity type disposed               
          between said source region and said storage region and adapted              
          for forming a controllable current path for charge carriers                 
          therebetween, said source, channel, and storage regions being               
          disposed in said semiconductor body;                                        



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