Ex parte UEDA et al. - Page 3




                    Appeal No. 95-4663                                                                                                                                     
                    Application 08/044,487                                                                                                                                 






                              The references of record relied upon by the examiner are:                                                                                    

                    Renner                                            4,371,605                               Feb.  1, 1983                                                
                    Uetani et al. (Uetani)                            0 460 416 A1                            Dec. 11, 1991                                                
                    (European Patent)                                                                                                                                      
                    Lamola et al. (Lamola), Solid State Technology, ?Chemically                                                                                            
                    Amplified Resists?, No. 8, pages 53-60 (1991).                                                                                                         

                              The appealed claims stand rejected for obviousness (35 USC                                                                                   
                    § 103) over Uetani in view of Lamola and Renner.                                                                                                       
                              We reverse.                                                                                                                                  
                              The subject matter on appeal is directed to a chemically                                                                                     
                    amplified  positive photoresist composition useful in deep2                                                                                                                                    
                    ultraviolet lithography which composition includes an alkali-                                                                                          
                    soluble resin (referred to as a novolak resin), a dissolution                                                                                          
                    inhibitor and a photo-induced acid precursor.  The alkali-soluble                                                                                      
                    novolak resin is produced through a condensation reaction of an                                                                                        
                    aldehyde with a phenol compound, including a compound of general                                                                                       


                              2    The phrase ?chemically amplified resist? is a coined term which has been                                                                
                    defined as a resist material in which exposure, followed by a post exposure bake,                                                                      
                    results in the formation of a catalytic photoproduct, the three-dimensional                                                                            
                    distribution of which defines the latent image. See page 54, the first full                                                                            
                    paragraph of Lamola.                                                                                                                                   
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