Appeal No. 1997-1015
Application No. 08/168,713
BACKGROUND
The appellant's invention relates to a method for the processing of defective
elements in a memory. An understanding of the invention can be derived from a reading of
exemplary claim 1, which is reproduced below.
1. A method for replacing defective elements of a memory array further comprising
redundant elements, the memory array having undergone a test for the detection of
defective elements, wherein said method comprises the following steps:
a) for each defective element detected:
- searching for a first non-defective redundant element which is
unassigned by testing of the redundant elements which have not
been assigned, and then
- assigning this first non-defective redundant element to the
defective element; and thereafter
b) after the assigning of a redundant element to each defective element has been
achieved, replacing each defective element with the assigned redundant element.
The prior art references of record relied upon by the examiner in rejecting the
appealed claims are:
Saito et al. (Saito) 4,860,260 Aug. 22, 1989
Choi et al. (Choi) 5,299,161 Mar. 29, 1994
(Filed Nov. 18, 1991)
Claims 1 and 3-15 stand rejected under 35 U.S.C. § 103 as being unpatentable
over Saito. Claims 2 and 17 stand rejected under 35 U.S.C. § 103 as being unpatentable
over Saito in view of Choi.
2
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