Ex parte PIGNON - Page 4




              Appeal No. 1997-1015                                                                                       
              Application No. 08/168,713                                                                                 


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              addressed the language of the invention as set forth in claims 1 and 13.    We agree with                  
              appellant.  The examiner has addressed the language of the claims and their limitations in                 
              a general way rather than addressing the specific interrelation of the process steps.  (See                
              final rejection at pages 3-5 which is incorporated into the answer at page 4.)  Here, the                  
              examiner addresses the individual steps and general functions being carried out by Saito.                  
              In the Response to argument section, the examiner addresses the arguments with respect                     
              to claim 23, which has been canceled by an amendment filed July 17, 1996.                                  
                     Appellant argues that Saito does not teach or suggest the “SEQUENCE of steps”                       
              as set forth in the language of claim 1.  (See brief at page 10.)   We agree with appellant.               
              Appellant further argues that:                                                                             
                     [W]hile Saito uses a single method for testing the main memory and the                              
                     spare memory, the primary embodiment of the present application applies                             
                     two different methods for testing the main memory and the spare memory, in                          
                     order to improve the time needed to test and repair the memory.  This                               
                     inventive method is different from that of Saito, and gives a corresponding                         
                     advantage in speed.                                                                                 
              See brief at page 12.  (Emphasis in original.)  We agree with appellant.                                   
                     The examiner addresses claim 1 in the examiner’s answer in response to the reply                    
              brief.  Here, the examiner states that  “[c]laim 1 can be interpreted as describing the                    


                     While we agree that the examiner has not addressed the limitation in claim 13 pertaining to2                                                                                                  
              “repeatedly,” we note that appellant has neither presented support for this limitation in the specification as
              originally filed nor explained the limitation as it relates to the disclosed invention or prior art.  We question
              whether appellant intends to repeatedly search and assign redundant elements even after the first non-     
              defective element is located wherein all elements are retested in the sequence which were previously       
              assigned.  Or, does appellant intend a different interpretation?                                           
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