Ex parte LYONS et al. - Page 2




             Appeal No. 1997-0552                                                                               
             Application No. 08/267,490                                                                         


                                                BACKGROUND                                                      

                   The appellants’ invention relates to a method and apparatus for manufacturing a              
             programmed electronic control unit (ECU) for use in an anti-lock braking (ABS) system.             
             An understanding of the invention can be derived from a reading of exemplary claim 1,              
             which is reproduced below.                                                                         
                   1. A method for manufacturing a programmed ECU for use in an anti-lock braking               
             (ABS) system in a manufacturing area, the method comprising the steps of:                          
                   providing a memory programmer having a programming head in the manufacturing                 
             area;                                                                                              
                   programming the memory programmer with an ABS control program for the ABS                    
             system and at least one test program;                                                              
                   conveying a semiconductor having non-volatile memory space to the programming                
             head, the programming head receiving and retaining the semiconductor;                              
                   utilizing the memory programmer to program at least a portion of the non-volatile            
             memory space with the ABS control program;                                                         
                   utilizing the memory programmer to test the programmed semiconductor with the at             
             least one test program;                                                                            
                   providing a marker in the manufacturing area;                                                
                   programming the marker with a marking program;                                               
                   conveying the programmed semiconductor to the marker;                                        
                   receiving and retaining the programmed semiconductor on the marker;                          
                   utilizing the marker to mark a surface of the semiconductor with indicia related to          
             the ABS system based on the marking program;                                                       

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