Ex Parte MIZUNO et al - Page 5




          Appeal No. 2000-0452                                                        
          Application No. 08/622,389                                                  

          absent Appellant’s teaching regarding the control of power                  
          consumption and operation speed of the logic circuit” (brief at             
          pages 6 and 7).                                                             
               The examiner asserts (answer at page 4) that “it would have            
          been obvious . . .  to employ the teaching of Tomisawa to control           
          the delay time of other logic circuits . . . so that the control            
          of all the transistors on the same substrate could be uniform and           
          [all the transistors] are subject to similar process variations,            
          thus, the delay time for all the logic circuits could be                    
          controlled similarly.”  The examiner further asserts in response            
          to the lack-of-motivation argument (answer at page 9) that “the             
          combination is based on the teachings of Tomisawa and Kamisaka to           
          control the delay time of other logic circuits in a similar                 
          manner as the oscillator of Tomisawa and the delay of Kamisaka              
          are controlled.”                                                            
               In providing motivation or a suggestion to combine, we note            
          that the Federal Circuit states, in In re Lee, 277 F.3d 1338,               
          1342-43, 61 USPQ2d 1430, 1433 (Fed. Cir. 2002),                             
               [t]he essential factual evidence on the issue of                       
               obviousness is set forth in Graham v. John Deere Co.,                  
               383 U.S. 1, 17-18, 148 USPQ 459, 467 (1966) and                        
               extensive ensuing precedent. The patent examination                    
               process centers on prior art and the analysis thereof.                 



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