Ex Parte HOWARD - Page 4



          Appeal No. 2000-0937                                                        
          Application 08/959,620                                                      

          According to appellant, the polysilicon layer 108 in Sudo is                
          disposed substantially below the surface of substrate 101 to make           
          room for the monosilicon plug 111 [brief, pages 7-10].  The                 
          examiner responds that the lower electrode in Sudo is recessed              
          only slightly below the surface of the substrate just as in                 
          appellant’s invention [answer, pages 5-7].  Appellant responds              
          that based on the dimensions disclosed by Sudo, the lower                   
          electrode is substantially recessed when compared to the slight             
          recess of the claimed invention [reply brief].                              
          Based on the record before us, we will sustain the                          
          rejection of claims 1-9.  The concept of the lower electrode of             
          the capacitor being recessed slightly below the surface of the              
          substrate appears nowhere in appellant’s specification.  This               
          fact would suggest that the invention was not based on the                  
          particular amount of recess of the lower electrode.  In fact, the           
          specification makes only one reference to the amount of recess.             
          Specifically, the specification states that “[t]he amount that              
          the polysilicon within the containers 52a and 52b is recessed               
          should be carefully controlled because capacitance will be lost             
          as the first conductive layers or plates 54a and 54b become                 
          smaller” [page 14].  Thus, the amount of recess would appear to             
          be only a function of the lower conductive layer being able to              
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