Ex Parte CHEN et al - Page 9



          Appeal No. 2000-1251                                                            
          Application No. 08/843,786                                                      
          start-up signal as recited in claim 12 or resetting the IC based                
          on the receipt of the test mode start-up signal as recited in                   
          claim 20.                                                                       
               We therefore fail to find that Slemmer or Miyawaki disclose                
          or teach "a reset circuit responsive to the test mode start-up                  
          signal for resetting the integrated circuit after the integrated                
          circuit has erroneously entered a test mode during normal                       
          operation" as recited in claim 12 or a method "for protecting an                
          integrated circuit against the consequences of having erroneously               
          entered a test mode during normal operation . . ., wherein the                  
          method comprises the steps of: (a) generating a test mode start-                
          up signal during normal operation of the integrated circuit; and                
          (b) resetting the integrated circuit based on the receipt of the                
          test mode start-up signal" as recited in claim 20.  As such, we                 
          cannot sustain the rejection of claims 12 and 20 as being obvious               
          over Slemmer in view of Miyawaki.                                               
               We now turn to the rejection of claims 13 and 21-22 under                  
          35 U.S.C. § 103 as being unpatentable over Slemmer in view of                   
          Miyawaki and McClure.  The Examiner has not relied on the McClure               
          reference to teach or suggest a reset circuit responsive to the                 
          test mode start-up signal for resetting the IC after the IC has                 
          erroneously entered a test mode during normal operation as                      

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