Ex Parte IMAMURA et al - Page 12



          Appeal No. 1997-0897                                                        
          Application No. 08/227,992                                Page 12           

               We turn next to the rejection of claims 12-15, 23, and 25-27           
          under 35 U.S.C. § 103 as unpatentable over Koch and the admitted            
          prior art.  We begin with independent claims 12 and 23. The                 
          examiner’s position (answer, pages 5 and 6) with respect to                 
          independent claims 12 and 23, is that the admitted prior art of             
          figure 5 does not show focal length changing means.  To overcome            
          this deficiency of the admitted prior art, the examiner turns to            
          Koch for a teaching of this feature, relying upon col. 1, lines             
          1-7 of Koch.  The examiner states (answer, page 6) that:                    
                    These claims, as best understood, are directed                    
               to a method of selecting from a plurality of variations                
               the item or position which gives the best result, in                   
               this case, a correct focal length.                                     
                    It is well-known in assembling devices of any                     
               kind that when parts available vary in dimension,                      
               best results can be obtained by trial and error, ie,                   
               by trying different specimens of a given part or trying                
               a single part in different attitudes, until a best                     
               result is obtained.  This approach is not just                         
               well-known, but intuitive.  It can be observed on an                   
          assembly line or in a sandwich shop.                                        
                    It is common to chamfer the edges of transparent                  
          coverings on imaging devices in order to reduce the                         
               risk of injury to a user.  Further, it is inherent in                  
               the manufacture of chamfered transparent coverings                     
               that variations in thickness or chamfer depth may occur,               
               and also that dimensions of inner sidewalls of a device                
               frame may vary.  Thus it would have been obvious to one                
               of ordinary skill in the art to select an appropriate                  
               covering through trial and error, ie, trying different                 
               coverings, or trying a single covering in different                    
               orientations or angles, until a best result was obtained.              







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