Ex Parte McQueen - Page 2




                 Appeal No. 2003-1367                                                                                                             
                 Application No. 09/640,237                                                                                                       
                 depositing a first barrier layer over said substrate;                                                                            
                 planarizing said first barrier layer;                                                                                            
                 forming a first opening through said first barrier layer to expose a portion of said active region;                              
                 filling said first opening with a first conductive material to form a contact plug;                                              
                 forming an individual conductive contact land over said contact plug, said individual conductive                                 
                         contact land covering only a single contact plug;                                                                        
                 depositing a second barrier layer over said first barrier layer and said individual conductive                                   
                         contact land;                                                                                                            
                 forming a second opening though said second barrier layer to expose a portion of said individual                                 
                         conductive contact land; and                                                                                             
                 filling said second opening with a second conductive material to form said contact.                                              
                 8.  A method of producing a bipolar transistor for the dissipation of electrostatic discharges,                                  
                 comprising:                                                                                                                      
                 providing an intermediate structure comprising a substrate having at least one thick field                                       
                         oxide area, and at least one active area including at least one implanted drain region,                                  
                         and at least one implanted source region, said intermediate structure further including                                  
                         at least one transistor gate member spanned between said drain region and said source                                    
                         region on said substrate active area;                                                                                    
                 depositing a first barrier layer substantially covering said at least one field oxide area, said at                              
                         least one active area, and said at least one transistor gate member;                                                     
                 planarizing said first barrier layer to expose said at least one transistor gate member;                                         
                 patterning a first etch mask on said first barrier layer, wherein said first etch mask includes                                  
                         openings substantially over said at least one drain region and over said at least one                                    
                         source region;                                                                                                           
                 etching said first barrier layer to expose said at least one drain and said at least one source                                  
                         region in said substrate forming at least one drain via and at least one source via,                                     
                         respectively;                                                                                                            
                 removing said first etch mask;                                                                                                   
                 depositing a layer of first conductive material over said etched first barrier layer to fill said at                             
                         least one drain via and said at least one source via;                                                                    
                 planarizing said first conductive material forming at least one drain contact plug and at least                                  
                         one source contact plug in said at least one drain via and said at least one source via,                                 
                         respectively;                                                                                                            
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