Ex Parte Chwalek et al - Page 5



          Appeal No. 2005-0284                                                        
          Application No. 10/035,902                                                  

          ordinary skill in the art would not understand the nozzle                   
          arrangement depicted in Hawkins to be a linear array.                       
               Upon return of this application to the examiner, the                   
          examiner should weigh the propriety of introducing a rejection of           
          claim 2 under 35 U.S.C. § 103.                                              
               In conclusion, based on the foregoing, the examiner's                  
          rejection of claims 1 and 3-8 is affirmed, whereas the examiner's           
          rejection of claim 2 is reversed.  Accordingly, the examiner's              
          decision rejecting the appealed claims is affirmed-in-part.                 
               No time period for taking any subsequent action in                     
          connection with this appeal may be extended under 37 CFR                    
          § 1.136(a)(1)(iv) (effective Sep. 13, 2004; 69 Fed. Reg. 49960              
          (Aug. 12, 2004); 1286 Off. Gaz. Pat. Office 21 (Sep. 7, 2004)).             
                                  AFFIRMED-IN-PART                                    

                         EDWARD C. KIMLIN              )                              
                         Administrative Patent Judge   )                              
                                                       )                              
                                                       )                              
                                                       )                              
                         TERRY J. OWENS                ) BOARD OF PATENT              
                         Administrative Patent Judge   )   APPEALS AND                
                                                       )  INTERFERENCES               
                                                       )                              
                                                       )                              
                         PETER F. KRATZ                )                              
                         Administrative Patent Judge   )                              
          ECK:clm                                                                     
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