Ex Parte Johnson et al - Page 2




         Appeal No. 2006-1797                                                       
         Application No. 09/866,319                                                 

                                     Invention                                      
         Appellants’ invention relates generally to a high voltage                  
         silicon germanium (SiGe) heterojunction bipolar transistor having          
         improved AC performance.  The SiGe bipolar transistor includes an          
         emitter (28), a base (22), a collector (14), isolation regions             
         (20) and a base collector junction.  The collector includes a              
         subcollector region (12) a deep collector region (16) and an n-            
         type dopant region (18) between the subcollector (12) and the              
         base collector junction.  The n-type dopant region (18) is                 
         located atop and in contact with the deep collector (16).                  
         Further, the n-type dopant region has a vertical width                     
         sufficiently narrow to avoid lowering the collector-base                   
         breakdown voltage and a dopant concentration sufficiently high to          
         restrict the base widening when the base-emitter junction is               
         forward biased.                                                            


              Claim 45 is representative of the claimed invention and is            
         reproduced as follows:                                                     
              45. A method of fabricating a bipolar device comprising the           
         steps of:                                                                  
              (a) providing a structure comprising at least a sub-                  
                   collector region, a collector region and isolation               
                   regions, said collector region including a deep                  
                   collector region located therein;                                
              (b) forming a n-type dopant region within said collector              
                   region so as to be in contact with said deep collector,          
                   said n-type dopant region having a vertical width                

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