Ex parte LEENAARS et al. - Page 6




          Appeal No. 94-3000                                                          
          Application 07/914,654                                                      


          the wafer with deionized water.  See column 1, lines 19-28.                 
          This conventional drying technique is said to create "a                     
          significant amount of waste over the period of a month, for                 
          example, and also a significant fire hazard."  See column 1,                
          lines 28-30.                                                                
               Similarly, the Kurokawa reference discloses three                      
          different conventional drying techniques which are known to                 
          remove water drops on the wafers.  See column 1, lines 22-37.               
          One of the conventional drying techniques involves employing                
          vapor of organic solvent, such as isopropyl alcohol (IPA).                  
          See column 1, lines 38-48.   According to column 2, lines 6-12              
          of Kurokawa, "although the IPA vapor drying method is less                  
          sensitive to the influence of impurities in the ultra-pure                  
          water since the water that is used in the washing is replaced               
          with IPA, it has the problem of adhesion of impurities in the               
          IPA due to the dispersion of IPA mist and the problem of                    
          replacement between the IPA and the water."                                 
               At issue is, therefore, whether the use of a conventional              
          IPA vapor drying method to dry the water-treated wafers                     
          withdrawn from a deionized water containing tank as taught by               


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