Ex parte CHRISTEL et al. - Page 14




               Appeal No. 95-3557                                                                                                    
               Application No. 07/833,417                                                                                            

                               epitaxially growing a layer of n-type doped silicon on said substrate to said                         
                       flexure section thickness y; and                                                                              
                               etching away p-type doped silicon material with a p-type doped silicon etchant                        
                       leaving said boss section having a thickness x and said flexure section having a                              
                       thickness y.                                                                                                  


                               10.  A method of chemical machining of silicon material with a boss section                           
                       joined by a flexure section from a substrate of boron doped silicon material having a                         
                       resistivity of from 4 to 6 ohms-cm, said boss section thicker than said flexure section,                      
                       said method comprising the steps of:                                                                          
                               (1)  providing a mask of silicon dioxide on said substrate over said flexure                          
                       section;                                                                                                      
                               (2)  diffusing phosphorus dopant material into said substrate so as to provide a                      
                       phosphorus doped silicon material at a depth (x-y) from a surface of the substrate, said                      
                       diffusing being provided only in the regions of the boss section, where x is the boss                         
                       section thickness and y is the flexure section thickness, said diffusing step including the                   
                       steps of:                                                                                                     
                               implantation of phosphorus dopant ions in said substrate; and                                         
                               annealing said substrate so as to eliminate crystal lattice defects and to at least                   
                       partially diffuse said phosphorus dopant ions;                                                                
                               (3)  epitaxially growing a layer of phosphorus doped silicon on said substrate to                     
                       said flexure section thickness y over the surface of the boron doped silicon substrate                        
                       and the areas of diffusion phosphorus doped silicon; and                                                      




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