Ex Parte LIU et al - Page 6




          Appeal No. 2004-0721                                                               
          Application No. 09/401,409                                                         

          consequence of yielding to these arguments would be to read a                      
          limitation of the specification into these claims.                                 
                We reach this determination for a number of reasons.                         
                First, there is a heavy presumption that a claim term                        
          carries its ordinary and customary meaning.  Amgen Inc. v.                         
          Hoechst Marion Roussel Inc., 314 F.3d at 1327, 65 USPQ2d at 1394.                  
          As previously indicated, the appellants at least implicitly have                   
          conceded that the ordinary and customary meaning of the claim                      
          term “on” encompasses the interpretation urged by the examiner                     
          whereby the here claimed depositing step may be regarded as                        
          encompassing Xu’s step of depositing an oxide indirectly on a                      
          low-k dielectric material.  Though such a claim interpretation is                  
          broad, it is not unreasonable or inconsistent with the                             
          appellants’ specification since the specification contains no                      
          restricted definition of the term “on” which would require the                     
          more narrow claim construction asserted by the appellants.  See                    
          In re Hyatt, 211 F.3d at 1372-73, 54 USPQ2d at 1668.                               
                In addition, it is significant that the subject                              
          specification disclosure does not in any way exclude an                            
          embodiment in accordance with the examiner’s claim interpretation                  
          wherein the appellants’ oxide is deposited indirectly on the low-                  
          k dielectric material.  For example, the etch-back and other                       

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