Ex Parte Cannata et al - Page 6



              Appeal No. 2006-1049                                                                                       
              Application No. 09/667,826                                                                                 

              imaging systems employing either non-cooled or cryogenically cooled focal plane                            
              arrays.  (U.S. Patent 5,811,808, col. 1, lines 7-11).                                                      
                     2. Applicants state at column 2, lines 5-8, that:                                                   
                     A consideration which is extremely important for maximizing the                                     
                     quality of the output image from a focal plane array infrared detector                              
                     is compensating for nonuniformity in the individual detector elements                               
                     in the array.                                                                                       
                     3. Applicants further state at column 2, lines 8-17, that:                                          
                     Whereas ideally a uniform temperature scene directed to the focal                                   
                     plane array would produce a completely uniform output at each pixel,                                
                     in practice, the output of the individual detector elements may vary by                             
                     a significant percentage of the average output level. When an actual                                
                     scene is detected, such detector element nonuniformity can                                          
                     significantly degrade the image quality or even completely mask the                                 
                     actual image. This degrading of the image due to detector element                                   
                     nonuniformity is sometimes called spatial or fixed pattern noise.                                   
                     4. Applicants opine at column 2, lines 33-42, that:                                                 
                     The problem of nonuniformity in the detector elements is directly                                   
                     related to issues of manufacturing throughput and cost. That is, if very                            
                     high uniformity is required for the detector arrays to ensure good                                  
                     image quality, the number of focal plane arrays which must be                                       
                     rejected will increase on average. This in turn reduces throughput,                                 
                     increasing per unit costs. Therefore, it is generally preferable for                                
                     nonuniformity to be tolerated by virtue of compensation in the                                      
                     detector electronics rather than controlling nonuniformity during                                   
                     detector array fabrication.                                                                         


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