Ex parte THEOBALD - Page 5




          Appeal No. 95-0907                                                          
          Application 07/774,757                                                      

          specific than the general background noted above.  It is not                
          apparent how the generic feature of simply driving the device               
          under test through a sequence of testing procedures would require           
          undue experimentation on the part of one with ordinary skill in             
          the art.  Not every implementation detail has to be described in            
          a prior art reference.  Even a patent specification need not                
          disclose what would be well known in the art.  In re Buchner,               
          (Fed. Cir. March 1991); Lindemann Maschinenfabrik GMBH v.                   
          American Hoist & Derrick Co., 730 F.2d 1452, 1463, 221 USPQ 481,            
          489 (Fed. Cir. 1984).                                                       
               It is also the appellant's burden to establish that the                
          prior art is nonenabling.  In re Payne, 606 F.2d 303, 314-15, 203           
          USPQ 245, 255-56 (CCPA 1979).  Here, no declaration evidence has            
          been submitted by the appellant from anyone with an opinion on              
          whether the background and generic teachings of Wang would have             
          been nonenabling with respect to one with ordinary skill in the             
          art.  Without such evidence and in light of the general nature of           
          Wang's teaching, the appellant has not established that Wang is             
          nonenabling with respect to what it has been relied on to show.             
               However, we agree with the appellant that it is highly                 
          artificial to regard Rattan's peripheral units as subdevices of a           
          system or overall device under test.  The plurality of                      


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