Ex parte DAS et al. - Page 2




          Appeal No. 95-3936                                                          
          Application 08/135,324                                                      
          examiner has indicated in his advisory action (Paper Number 24              
          - mailed on June 9, 1994) that claims 15 through 17 and 23                  
          through 25 are allowed.  Claim 11 has been objected to in the               
          advisory action without explanation of the basis for the                    
          objection.  Accordingly, only claims 10 and 12 through 14 are               
          before us for consideration and claims 11, 15 through 17 and                
          23 through 25 form no issue in this appeal.                                 
                                    THE INVENTION                                     
                    The claimed invention is directed to a process for                
          forming a photoresist pattern.  The process comprises the                   
          conventional steps of coating a wafer with a photoresist,                   
          irradiating the photoresist with radiation of a predetermined               
          wavelength to generate photoacid defining a latent image in                 
          said photoresist and baking the latent image formed by the                  
          photoacid. Appellants discovered that by protecting the latent              
          image formed on the photoresist on the wafer after generation               
          of photoacid but before baking the latent image a sharper,                  
          better defined image is obtained.                                           
                    Claim 10, the sole independent claim before us, is                
          reproduced below for a more facile understanding of                         
          appellants' claimed invention.                                              
                    10.  A process for forming a photoresist pattern                  
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