Appeal No. 97-1042
Application No. 07/969,541
The disclosed invention relates to a method of testing a
semiconductor device.
Claim 10 is illustrative of the claimed invention, and it
reads as follows:
10. A method of testing a semiconductor device,
comprising the steps of:
providing a plurality of wiping contacts;
providing a semiconductor device having a plurality of
leads;
positioning the semiconductor device wherein the
plurality of leads are between, but not making electrical
contact to the plurality of the wiping contacts;
moving the semiconductor device in one direction from the
point where the plurality of leads are between, but not making
electrical contact to the plurality of the wiping contacts
past the plurality of the wiping contact wires such that the
plurality of the leads of the semiconductor device are no
longer between the plurality of wiping contacts, wherein at
least one of the plurality of wiping contacts makes electrical
contact to a side of one of the plurality of leads of the
semiconductor device during the moving of the semiconductor
device.
The reference relied on by the examiner is:
Vancelette 4,320,339 Mar. 16,
1982
teachings of Pfaff, and claims 2 through 8 to be obvious over
the combined teachings of Pfaff and Cedrone.
2
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