Appeal No. 96-0086
Application 07/979,607
The invention pertains to the remote testing of IC chips by employing radio frequency (RF)
transmission.
The nature of the invention is clear from an analysis of representative independent claim 1,
reproduced as follows:
1. A testing system for evaluating an integrated circuit chip comprising:
(A) an interrogator unit having a radio communication range, the interrogator unit comprising
data evaluation means for transmitting interrogating information via radio communication and for
receiving test data via radio communication;
(B) an integrated circuit chip positioned remotely from the interrogator unit, but within the radio
communication range, comprising:
operational circuitry;
test interface circuitry electrically coupled to the operational circuitry and including means for
receiving the interrogating information from the data evaluation means of the interrogator unit, the test
interface circuitry test cycling the operational circuitry according to the interrogating information, the test
interface circuitry including means for transmitting via radio communication test data output by the
operational circuitry in response to the interrogating information back to the data evaluation means of
the interrogator unit; and
the data evaluation means including means for examining the test data to determine whether the
integrated circuit chip has a defect.
The examiner relies on the following reference:
Katayama 5,113,184 May 12, 1992
2
Page: Previous 1 2 3 4 5 6 7 Next
Last modified: November 3, 2007