Ex parte LITTLE - Page 7




                  Appeal No. 96-2120                                                                                                                      
                  Application 08/300,097                                                                                                                  



                  construed to include differences which result from manufacturing tolerances that are totally                                            
                  unintended and undesired by appellant’s invention.  The examiner’s reading of “different”                                               
                  as including unintended differences caused by manufacturing tolerances would make it                                                    
                  almost impossible for appellant to claim his invention because nothing can be                                                           
                  predetermined according to the examiner’s analysis.  This is an interpretation of the claim                                             
                  language which we cannot accept.                                                                                                        
                  For all the reasons just discussed, we do not sustain the examiner’s rejection of                                                       
                  claims 15, 20 and 21 under 35 U.S.C. § 103.  Therefore, the decision of the examiner                                                    
                  rejecting claims 15, 20 and 21 is reversed.                                                                                             
                                                                    REVERSED                                                                              

                                                      Jerry Smith                                  )                                                      
                                                      Administrative Patent Judge                  )                                                      
                                                                                                   )                                                      
                                                                                                   )                                                      
                                                                                                   ) BOARD OF PATENT                                      
                                                      Lee E. Barrett                               )                                                      
                                                      Administrative Patent Judge                  )   APPEALS AND                                        
                                                                                                   )                                                      
                                                                                                   ) INTERFERENCES                                        
                                                                                                   )                                                      
                                                      Jameson Lee                                  )                                                      
                                                      Administrative Patent Judge                  )                                                      
                  William H. Meise                                                                                                                        
                  Lockheed Martin Corporation                                                                                                             
                  Patent Operation                                                                                                                        

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