Appeal No. 1997-1201
Application No. 08/200,616
BACKGROUND
The appellants’ invention relates to a high speed lead inspection system using back
lighting of the leads and calibration marks on the track. Both the leads and the track are
viewed at the same time on a common display with the calibration markings on the track.
An understanding of the invention can be derived from a reading of exemplary claim 1,
which is reproduced below.
1. A lead inspection system utilizing image capture to determine defects in lead
placement, comprising:
a track for holding a semiconductor device to be inspected;
means for viewing a first side of said track and leads of said semiconductor device
under inspection to form a first image and a second side of said track and leads of said
semiconductor device under said inspection to form a second image;
an optical system for combining said first image and said second image of said
first side and said second side into one video display; and calibration marks on said first
side and said second side of said track adjacent the leads of said semiconductor device
for providing calibration information with the leads to determine a position of the leads.
The prior art references of record relied upon by the examiner in rejecting the
appealed claims are:
Spigarelli et al. (Spigarelli) 4,914,513 Apr. 03, 1990
Frazee, Jr. et al. (Frazee) 4,973,343 Nov. 27, 1990
Chemaly 5,058,177 Oct. 15, 1991
Howell 5,237,622 Aug. 17, 1993
Claims 1-6, 8-13 and 15-17 stand rejected under 35 U.S.C. § 103 as being
unpatentable over Chemaly in view of Spigarelli and Howell. Claims 7 and 14 stand
2
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