Appeal No. 1997-0339
Application 08/330,768
invention captures the test signal for testing and provides
for testing both a true and complement data signal, rather
than just one of them as in the prior art, since either one or
both may be corrupted.
The invention is further illustrated below by claim 1.
1. A test circuit comprising:
means for selecting from a data path a test signal from
amount a true data signal and a complement data signal; and
means for capturing said test signal for testing.
The references relied on by the Examiner are:
Rickard et al. (Rickard) 4,638,183 Jan.
20, 1987
Dervisoglu et al. (Dervisoglu) 5,068,881 Nov.
26, 1991
Claims 1 to 8 and 10 to 16 stand rejected under 35 U.S.C.
§ 103 over Rickard. Claim 9 stands rejected under 35 U.S.C.
§ 103 over Rickard and Dervisoglu.
Reference is made to Appellants’ brief and the Examiner's
answer and for their respective positions.
OPINION
We have considered the record before us and we will
sustain the rejections of claims 1 to 16.
Appellants [brief, page 5] have elected to group claims
-2-
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