Ex parte WILLS et al. - Page 4




          Appeal No. 1999-0559                                                        
          Application No. 08/846,949                                                  


          include the shallow tank found in the device of JP '654, and                
          presently claimed, or, likewise, why the skilled artisan would              
          have been motivated to modify the Figure 2 embodiment of                    
          Japanese '654 to have both source/drain regions to be of the                
          same conductivity type, or to have modified the Figure 5                    
          embodiment of Japanese '654 to have the low resistance                      
          programmed area within one and only one of the source/drain                 
          regions.  We note that appellants' specification discloses at               
          page 1 that the programming method of Aswell is effective as                
          long as the substrate is biased at ground but does not take                 
          into account a substrate biased at a negative potential.                    
               In conclusion, based on the foregoing, the examiner's                  
          decision rejecting the appealed claims is reversed.                         
                                      REVERSED                                        



                         EDWARD C. KIMLIN              )                              
                         Administrative Patent Judge   )                              
                                                       )                              
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                                                       )                              
                                                       )                              
                         CHUNG K. PAK                  ) BOARD OF PATENT              
                         Administrative Patent Judge   )   APPEALS AND                
                                                       )  INTERFERENCES               
                                                       )                              
                                                       )                              
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