Ex parte CAREY et al. - Page 2




          Appeal No. 1999-0715                                                        
          Application No. 08/486,173                                                  



                    providing at least one conductive metal strip                     
               constructed to enable interconnection between                          
               electrodes of components to be electrically                            
               interconnected;                                                        
                    providing a metal-based material composed of a                    
               silver-silicone paste mixed with a hardening agent;                    
               and                                                                    
                    securing the at least one conductive metal strip                  
               to the electrodes using the metal-based material                       
               intermediate the metal strip and the electrode.                        
               In addition to the state of the art found in appellants’               
          specification, the examiner relies upon the following                       
          reference as evidence of obviousness:                                       
               Arndt               2,423,922           Jul. 15, 1947                  
               Appellants’ claimed invention is directed to a process of              
          electrically interconnecting electrodes of electronic                       
          components.  The process comprises utilizing a material                     
          composed of a silver-silicone paste and a hardening agent to                
          secure a conductive metal strip to the electrodes.  According               
          to appellants, “[e]lectrical interconnects made by this                     
          invention have shown no degradation under high current testing              
          while having a very low contact resistance value and have                   
          eliminated the solder-caused breakage problem for thin solar                
          cells” (page 2 of brief, penultimate paragraph).                            
                                          2                                           





Page:  Previous  1  2  3  4  5  6  7  8  Next 

Last modified: November 3, 2007