Appeal No. 1999-1788
Application No. 08/533,939
the rejection of claims 5 and 18, indicating that they are now
objected to as being dependent from a rejected base claim.
Therefore, claims 1, 6, 10, and 14 remain before us on appeal.
Appellant's invention relates to a method and apparatus
for simulating the electrical characteristics of a
semiconductor device. Claim 1 is illustrative of the claimed
invention, and it reads as follows:
1. A method for simulating the electrical
characteristic of an electronic device comprising the steps
of:
specifying the material of a part of interest of the
electronic device;
specifying the electrical characteristics of the part of
interest of the electronic device; and
specifying the shape of the part of interest of the
electronic device, said specification of the shape being
performed by selecting it from among several preselected
simplified shape models.
The prior art reference of record relied upon by the
examiner in rejecting the appealed claims is:
Gough et al., "An Integrated Device Design Environment for
Semiconductors," 10 IEEE Transactions on Computer-Aided Design
of Integrated Circuits and Systems no. 6, 808-21 (June 1991)
(Gough)
Claims 1, 6, 10, and 14 stand rejected under 35 U.S.C. §
103 as being unpatentable over Gough.
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