Ex parte KIM - Page 2




          Appeal No. 1998-2619                                                        
          Application No. 08/526,828                                                  





               1.  A method for adjusting gas flow in a flow-flange                   
          reactor to achieve a desired thickness profile, comprising the              
          steps of:                                                                   
               establishing a target thickness profile;                               
               determining a first set of optimum input-flow ratios in                
          response to said target thickness profile, based upon a first               
          plurality of sample thickness profiles and a first plurality                
          of sets of sample input-flow ratios, each of said sample                    
          thickness profiles corresponding to one set of said first                   
          plurality of sets of sample input-flow ratios;                              
               calculating from said input-flow ratios a gas flow for                 
          each of a plurality of gases supplied to said reactor; and                  
               open-loop control adjusting gas flow to said reactor for               
          each of said plurality of gases to produce said calculated gas              
          flow.                                                                       
               10.  A method for determining an input-flow ratio in a                 
          flow-flange reactor to achieve a desired thickness profile on               
          a digital computer, comprising the steps of:                                
               establishing a target thickness profile and storing data               
          representing said target thickness profile in memory;                       
               calculating a first set of optimum input-flow ratios in                
          response to said target thickness profile, said input-flow                  
          ratios being usable to calculate each of a plurality of gas                 
          flows to said reactor for producing said desired thickness                  
          profile in an open-loop control process, said input-flow                    
          ratios being based upon data stored in said memory, said data               
          representing a first plurality of sample thickness profiles                 
          and a first plurality of sets of sample input-flow ratios,                  
          each of said sample thickness profiles corresponding to one                 
          set of said first plurality of sets of sample input-flow                    
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