Ex Parte SWOBODA et al - Page 3


          Appeal No. 1999-2344                                                        
          Application 08/720,586                                                      

          the brief and reply brief as to this reference in his responsive            
          arguments portion of the answer.  Therefore, we reverse all                 
          rejections under 35 U.S.C. § 102 based upon Whetsel.                        
               We also reverse the rejections under 35 U.S.C. § 102 based upon        
          Powell and Hwang.  We agree with appellants’ observation at page 3          
          of the principal brief on appeal that Hwang and Powell disclose             
          essentially the same features with an essentially common disclosure.        
          The disputed language in representative claim 1 on appeal between           
          the examiner and appellants is the feature of claim 1 “a serial scan        
          generator embedded in the electronic system upon manufacture.”              
          Essentially the same features are recited in independent method             
          claim 10 on appeal.                                                         
               To simplify our consideration of the issues, we refer to the           
          following statements made by the appellants at the top of page 2 of         
          the reply brief:                                                            
               The Applicants have never argued that the references did               
               not teach a serial test scan generator.  The Applicants                
               urge that the cited references fail to show that the                   
               serial test scan generator is “embedded in the electronic              
               system upon manufacture” as recited in claim 1.  Thus the              
               Applicants do not dispute that Hwang et al and Powell et               
               al inherently disclose the serial test scan generator.                 
               However, the Applicants submit that this teaching of Hwang             
               et al and Powell et al fails to anticipate the recitation              
               in claim 1 that the “serial scan generator embedded in the             
               electronic system upon manufacture.”                                   



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