Ex Parte NG et al - Page 2




          Appeal No. 2002-1169                                                         
          Application No. 09/252,845                                                   


               The disclosed invention relates to an ion source in an ion              
          implantation system.  A source of electrical power in the ion                
          source is connectable to an electron source to cause the electron            
          source to create charged ions in a source gas to form a charged              
          plasma and to bias the electron source to cause cleansing of a               
          non-dopant component of the source gas by inert gas ion                      
          sputtering of the electron source.                                           
               Claim 1 is illustrative of the claimed invention, and it                
          reads as follows:                                                            
                    1.  For an ion implantation system, an ion source                  
               comprising:                                                             
                    a gas source for providing a source gas containing an              
                         ion implantation dopant gas and an inert gas;                 
                    an electron source surroundable by said source gas and             
                         subject to coating by a non-dopant component of               
                         said source gas;                                              
                    a source of electrical power connectable to said                   
                         electron source to cause said electron source to              
                         create charged ions in said source gas to form a              
                         charged plasma and to bias said electron source to            
                         cause cleansing of said non-dopant component of               
                         said source gas by inert gas ion sputtering of                
                         said electron source; and                                     
                    an ion extraction system for controlling charged ions              
                         from said charged plasma.                                     





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