Ex Parte BRUN et al - Page 4



          Appeal No. 2003-1263                                                        
          Application No. 09/068,999                                                  

          the presence of the semiconductor 40 in the joint, but does not             
          come to grips with the appellants’ argument that it is not an               
          insulator.  The examiner acknowledges (answer, pages 4 and 5)               
          appellants’ argument concerning the presence of other mechanical            
          links in Nishizawa, but fails to address this argument.  In the             
          absence of a response by the examiner, and the lack of any evidence         
          in the record that counters appellants’ arguments, we will reverse          
          the anticipation rejection of claims 2, 4, 5, 15 and 21.                    
               Pursuant to the provisions of 37 CFR § 1.196(b), the following         
          new rejection of claims 2, 4, 5, 15 and 21 is hereby entered.               
               Claims 2, 4, 5, 15 and 21 are rejected under the second                
          paragraph of 35 U.S.C. § 112 for indefiniteness.  The use of the            
          preposition “on” in the claimed phrases “formed on a wafer of               
          material” and “formed on said wafer” implies that the first and             
          second parts are formed on the surface of the wafer material as             
          opposed to in or within the wafer material as described in the              
          disclosure.  Thus, the claims on appeal are indefinite because they         
          are misdescriptive of the disclosed and claimed invention.                  





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