Appeal No. 2004-0267
Application 09/847,224
enough that the interceptor can be steered to the target (e.g.,
col. 2, lines 27-43). Saban calculates target range and velocity
(e.g., Fig. 5, block 61) but the examiner does not point out
where Saban teaches "ascertaining ... a target location error."
The only "pattern" mentioned is a "pattern recognition (PR)
analyzer" for detecting reflections that were scattered from a
target (col. 7, lines 40-67). The examiner does not explain how
recognizing a pattern from target reflections and noise in Saban
meets the claim limitation of "autonomously determining a pattern
[using a target location error]." Thus, the rejection of
claims 1-75 over Saban is reversed.
CONCLUSION
The rejections of claims 1-75 are reversed.
REVERSED
JERRY SMITH )
Administrative Patent Judge )
)
)) BOARD OF PATENT
LEE E. BARRETT ) APPEALS
Administrative Patent Judge ) AND
) INTERFERENCES
)
)
JOSEPH L. DIXON )
Administrative Patent Judge )
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