Appeal No. 2004-2368
Application No. 09/395,854 Page 2
BACKGROUND
Appellants' invention relates to a bypass circuit for
circuit testing and modification. An understanding of the
invention can be derived from a reading of claim 15, which is
reproduced as follows:
15. A method for testing an integrated circuit having a
first stage and a second stage, the method comprising:
testing an integrated circuit, which has a first stage and a
second stage, by serially propagating a signal through the first
stage and then through the second stage; and
upon the testing detecting a defect in the integrated
circuit, retesting the integrated circuit while bypassing the
first stage, wherein a re-detection of the defect by the
retesting of the integrated circuit indicates that the first
stage is non-defective, and a detection of no defect in the
integrated circuit by the retesting of the integrated circuit
indicates that the first stage is defective.
The prior art reference of record relied upon by the
examiner in rejecting the appealed claim is:
Lindberg et al. 5,663,967 Sep. 2, 1997
(Lindberg)
Claim 15 stands rejected under 35 U.S.C. § 102(b) as being
anticipated by Lindberg.
Rather than reiterate the conflicting viewpoints advanced by
the examiner and appellants regarding the above-noted rejection,
we make reference to the examiner's answer (Paper No. 12, mailed
March 26, 2004) for the examiner's complete reasoning in support
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