Ex Parte Chinou et al - Page 7



          Appeal No. 2005-2453                                                        
          Application No. 10/102,923                                                  

          appellants' specification attaches no criticality to the ratio of           
          thicknesses recited in claim 6, and appellants have failed to               
          proffer objective evidence which establishes the criticality.               
               In conclusion, based on the foregoing and the reasons well-            
          stated by the examiner, the examiner's decision rejecting the               
          appealed claims is affirmed.                                                
               No time period for taking any subsequent action in                     
          connection with this appeal may be extended under 37 CFR                    
          § 1.136(a)(1)(iv) (effective Sep. 13, 2004; 69 Fed. Reg. 49960              
          (Aug. 12, 2004); 1286 Off. Gaz. Pat. Office 21 (Sep. 7, 2004)).             
                                      AFFIRMED                                        


                         EDWARD C. KIMLIN              )                              
                         Administrative Patent Judge   )                              
                                                       )                              
                                                       )                              
                                                       )                              
                                                       )                              
                         THOMAS A. WALTZ               ) BOARD OF PATENT              
                         Administrative Patent Judge   )   APPEALS AND                
                                                       )  INTERFERENCES               
                                                       )                              
                                                       )                              
                                                       )                              
                         JEFFREY T. SMITH              )                              
                         Administrative Patent Judge   )                              
          ECK:clm                                                                     


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